LO, S. L.; TAN, K. W.; OUH, E. L. Automated doubt identification from informal reflections through hybrid sentic patterns and machine learning approach. Research and Practice in Technology Enhanced Learning, [S. l.], v. 16, 2021. DOI: 10.58459/rptel.2021.16%p. Disponível em: https://rptel.apsce.net/index.php/RPTEL/article/view/2021-16001. Acesso em: 12 jul. 2025.